拉斯维加斯赌城

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Experimental Physics IV

  1. University
  2. Faculties
  3. Faculty of Mathematics, Natural Sciences, and Materials Engineering
  4. Institute of Physics
  5. Chairs, professors and groups
  6. Experimental Physics IV
  7. Equipment
  8. Scanning Probe Microscope (AFM/MFM)

Scanning Probe Microscope (AFM/MFM)

For the characterization of the magnetic domain structures and the surface morphologies of nanoscale devices and structures, we use a custom-modified Bruker Dimension ICON3 scanning probe microscope allowing for various scanning probe measurements (i.e. AFM, MFM) at room temperature.

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Picture of AFM/MFM setup
Main components of AFM (MFM) setup
Magnetic force microscopy: concept of “lift mode” measurements.

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