Julian Lorenz
Telefon: | +49 (821) 598 4334 |
E-Mail: | julian.lorenz@uni-auni-a.de () |
Raum: | 1024 (N) |
Sprechzeiten: | Nach Vereinbarung |
Adresse: | Universit?tsstra?e 6a, 86159 Augsburg |
Lehre
- SoSe 2022: Multimedia Projekt
- WiSe 2022/2023: Multimedia Projekt
- ?SoSe 2023: Multimedia Projekt
Ver?ffentlichungen
2024 |
Julian Lorenz, Alexander Pest, Daniel Kienzle, Katja Ludwig and Rainer Lienhart. 2024. A fair ranking and new model for panoptic scene graph generation. In Ale? Leonardis, Elisa Ricci, Stefan Roth, Olga Russakovsky, Torsten Sattler, Gül Varol (Eds.). Computer Vision – ECCV 2024: 18th European Conference, Milan, Italy, September 29 – October 4, 2024, proceedings, part LXI. Springer, Berlin, 148-164 DOI: 10.1007/978-3-031-73030-6_9 |
Julian Lorenz, Robin Sch?n, Katja Ludwig and Rainer Lienhart. 2024. A review and efficient implementation of scene graph generation metrics. In Eric Mortensen (Ed.). 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Jun 16-22, 2024, Seattle, WA, USA. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, 2567-2575 DOI: 10.1109/CVPRW63382.2024.00263 |
Robin Sch?n, Julian Lorenz, Katja Ludwig and Rainer Lienhart. in press. Adapting the segment anything model during usage in novel situations. In Eric Mortensen (Ed.). IEEE / CVF Computer Vision and Pattern Recognition Conference (CVPR), Jun 17th-21st, 2024, Seattle, WA, USA. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ |
Luuk H. Boulogne, Julian Lorenz, Daniel Kienzle, Robin Sch?n, Katja Ludwig, Rainer Lienhart, Simon Jegou, Guang Li, Cong Chen, Qi Wang, Derik Shi, Mayug Maniparambil, Dominik Müller, Silvan Mertes, Niklas Schr?ter, Fabio Hellmann, Miriam Elia, Ine Dirks, Matias Nicolas Bossa, Abel Diaz Berenguer, Tanmoy Mukherjee, Jef Vandemeulebroucke, Hichem Sahli, Nikos Deligiannis, Panagiotis Gonidakis, Ngoc Dung Huynh, Imran Razzak, Reda Bouadjenek, Mario Verdicchio, Pasquale Borrelli, Marco Aiello, James A. Meakin, Alexander Lemm, Christoph Russ, Razvan Ionasec, Nikos Paragios, Bram van Ginneken and Marie-Pierre Revel Dubios. 2024. The STOIC2021 COVID-19 AI challenge: applying reusable training methodologies to private data. Medical Image Analysis 97, 103230. DOI: 10.1016/j.media.2024.103230 |
Daniel Kienzle, Katja Ludwig, Julian Lorenz and Rainer Lienhart. 2024. Towards learning monocular 3D object localization from 2D labels using the physical laws of motion. In Theodora Kontogianni, Akihiro Sugimoto, Gopal Sharma (Eds.). International Conference on 3D Vision 2024 (3DV), March 18-21, 2024, Davos, Switzerland. IEEE, Piscataway, NJ, 1564-1573 DOI: 10.1109/3DV62453.2024.00155 |
2023 |
Katja Ludwig, Julian Lorenz, Robin Sch?n and Rainer Lienhart. 2023. All keypoints you need: detecting arbitrary keypoints on the body of triple, high, and long jump athletes. In 2023 IEEE/CVF International Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), June 17 2023 to June 24 2023, Vancouver, BC, Canada. IEEE, Piscataway, NJ, 5179-5187 DOI: 10.1109/CVPRW59228.2023.00546 |
Daniel Kienzle, Julian Lorenz, Robin Sch?n, Katja Ludwig and Rainer Lienhart. 2023. COVID detection and severity prediction with 3D-ConvNeXt and custom pretrainings. In Leonid Karlinsky, Tomer Michaeli, Ko Nishino (Eds.). Computer Vision – ECCV 2022 Workshops: Tel Aviv, Israel, October 23–27, 2022, Proceedings, Part VII. Springer, Berlin, 500-516 DOI: 10.1007/978-3-031-25082-8_33 |
Katja Ludwig, Daniel Kienzle, Julian Lorenz and Rainer Lienhart. 2023. Detecting arbitrary keypoints on limbs and skis with sparse partly correct segmentation masks. In IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW), Jan. 3 2023 to Jan. 7 2023, Waikoloa, HI, USA. IEEE, Piscataway, NJ, 1-10 DOI: 10.1109/WACVW58289.2023.00051 |
Julian Lorenz, Florian Barthel, Daniel Kienzle and Rainer Lienhart. 2023. Haystack: a panoptic scene graph dataset to evaluate rare predicate classes. In 2023 IEEE International Conference on Computer Vision Workshops (ICCVW), October 2-6, 2023, Paris, France. IEEE, Piscataway, NJ, 62-70 DOI: 10.1109/ICCVW60793.2023.00013 |